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SN74BCT8240ADWRE4

Texas Instruments
SN74BCT8240ADWRE4 Preview
Texas Instruments
IC SCAN TEST DEVICE BUFF 24-SOIC
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Specifications

  • Product Status: Obsolete
  • Logic Type: Scan Test Device with Inverting Buffers
  • Supply Voltage: 4.5V ~ 5.5V
  • Number of Bits: 8
  • Operating Temperature: 0°C ~ 70°C
  • Mounting Type: Surface Mount
  • Package / Case: 24-SOIC (0.295", 7.50mm Width)
  • Supplier Device Package: 24-SOIC

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