SN74LVTH182512DGGR
Texas Instruments
Texas Instruments
IC SCAN-TEST-DEV/XCVR 64-TSSOP
$9.05
Available to order
Reference Price (USD)
2,000+
$4.44080
Exquisite packaging
Discount
TT / Paypal / Credit Card / Western Union / Money Gram
Upgrade your projects with SN74LVTH182512DGGR Texas Instruments Specialty Logic ICs, engineered for precision and efficiency. Key features include enhanced noise immunity, wide operating voltage ranges, and compact packaging, suitable for automotive, medical devices, and IoT applications. Trust Texas Instruments for cutting-edge logic solutions tailored to your needs. Request a quote now to explore customization options!
Specifications
- Product Status: Active
- Logic Type: ABT Scan Test Device With Universal Bus Transceivers
- Supply Voltage: 2.7V ~ 3.6V
- Number of Bits: 18
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 64-TFSOP (0.240", 6.10mm Width)
- Supplier Device Package: 64-TSSOP
Related Products
onsemi
MC10E416FNG
Microchip Technology
SY100EL16VFKG
onsemi
MC10EP16TDTG
Texas Instruments
SN74SSTVF16857VR
Texas Instruments
CD4089BE
National Semiconductor
MM74HC181WM
onsemi
MC10EP17DTG
Microchip Technology
SY100EP16UKG
onsemi
MC100EP16VBDG
onsemi