SN74ABT8646DWR
Texas Instruments

Texas Instruments
IC SCAN TEST DEVICE 28-SOIC
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SN74ABT8646DWR Texas Instruments Specialty Logic ICs set new benchmarks in signal integrity. Engineered with differential signaling, clock synchronization, and EMI reduction features, they re critical for data centers, ADAS, and high-frequency trading platforms. Trust Texas Instruments's globally certified products. Start a live chat to discuss your BOM requirements!
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Bus Transceiver and Registers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 28-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 28-SOIC